神兜兜和他的朋友们

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A. Caballero-Ruiz et al. / Mechatronics 17 (2007) 231–243 237
of B2 touched by B1 are made. This data is employed to
determine the center of B2 and the existing error on that
point. Due to the errors of MMT the measured surface
of the reference ball (B2) seems to be not spherical, but
inrealityit is. Using distortions ofthe sphere inexperimen-
tal data we can calculate the local errors of the MMT. The
fact of placing B2 on di?erent points within the MMT
workspace helps to establish an error pattern for the whole
workspace of the MMT (Fig. 9).
The measurements are divided into three groups: each
one preserves the position of one axis. The first measure-
ment group keeps the X axis in constant position and B1
moves along the Y and Z axes during the measurements;
Fig. 8. The proposed measurement system.
the second group keeps Y axis in constant position; and
the third one keeps Z axis in constant position. We only
measure many positions of B2 surface with the help of B1 explain the measuring procedure for the first group of mea-
by electrical contact. The probe (B1) is fixed to the tool surements, because all procedures are similar and the axes
support, while B2 is placed in di?erent positions within of movement are only changed. The measurement process
the MMT workspace. Several measurements of the surface is automatically carried out as follows:
Fig. 9. (a) Reference ball support; (b) proposed scheme and (c) set of possible positions.
Fig. 10. Measurement procedure steps.